| Number of arms | 4 (2 each, top and bottom) |
| Mountable probes | 1172 series |
| Number of test steps | Max. 900,000 steps |
| Measurement parameters and measurement ranges | Resistance : | 40.00 μΩ to 100.0 MΩ |
| 　 | Capacitance : | 10.00 fF to 40.00 mF |
| 　 | Inductance : | 10.00 μH to 100.0 mH |
| 　 | Diode VZ measurement : | 0.000 V to 25.00 V |
| 　 | Insulation resistance : | 200.0 Ω to 100.0 GΩ |
| 　 | Capacitance Insulation resistance : | 200.0 Ω to 10.00 MΩ |
| 　 | High voltage resistance : | 200.0 Ω to 25.00 GΩ |
| 　 | High voltage short resistance : | 400.0 mΩ to 400.0 kΩ |
| 　 | Leak current measurement : | 100.0 nA to 10.00 mA |
| 　 | Zener diode VZ measurement : | 0.000 V to 25.00 V |
| 　 | Digital transistor measurement : | 0.000 V to 25.00 V |
| 　 | Photo couplers measurement : | 0.000 V to 25.00 V |
| 　 | Continuity test : | 400 mΩ to 1.000 kΩ |
| 　 | Open test : | 4.000 Ω to 4.000 MΩ |
| 　 | Short test : | 400.0 mΩ to 40.00 kΩ |
| 　 | DC voltage measurement : | 40.00 mV to 25.00 V |
| Judgment range | -99.9% to +999.9% or absolute value |
| Minimum pad pitch | 35um (with CP1075-09)(when using FA1971-01)
40um (with CP1075-09) |
| Minimum pad size | 5um (with CP1075-09)(when using FA1971-01)
10um (with CP1075-09) |
| Measurement speed | Max. 100 points/ s (X-Y movements of 0.1 mm, 4-arm simultaneous probing, when capacitance measurement) |
| Testable board size | Thickness : 0.1 mm to 2.5 mm (0.10 in)
Outer dimensions : 50 mm (1.97 in) W × 50 mm (1.97 in) D to 400 mm (15.75 in) W × 330 mm (12.99 in) D |
| Maximum testable area | 400 mm (15.75 in) W × 324 mm (12.76 in) D |
| Board clamping | Board 2-side chuck method (with tension function) |
| Power supply | 200 V, 220 V, 230 V, 240 V AC single-phase (specify at time of order), 50/60 Hz, 5 kVA |
| Dimensions and mass | 1360 mm (53.54 in) W × 1200 mm (47.24 in) H × 1280 mm (50.39 in) D, (Excluding protruding parts), 1,100 kg (38,800.7 oz) |